Design & Manufacture of Multifunctional Nanoscale Computed Tomography System

Strain and Defect Analyzer of SiC Ingot/Wafer

Using X-ray NDT method to obtain the orientation, strain/stress and BPD/TED/TSD defects of SiC ingots and wafers in very short inspection time.

MetalJet C2

The Excillum MetalJet C2 offers an attractive, cost effective version of the metal-jet X-ray source technology with simplified electron optics producing a round electron beam focus. The Excillum Meta

MetalJet D2+

The Excillum MetalJet D2+ features our unique metal-jet anode technology and advanced electron optics. Achieving significantly higher brightness and smaller spot sizes than any other available microfo

MetalJet D2+ 160 kV

MetalJet D2+ 160 kV

MetalJet E1+ 160 kV

At 1000 watts, the new Excillum MetalJet E1+ delivers 17 times more X-ray flux across a broad spectral range compared to a 30 W conventional tungsten-solid-anode microfocus source with the same 30 µm

Montel Multilayer Optics

A Montel optic is two mirrors shaped in one plane each placed next to each other so that X-rays reflected from both surfaces are focused or collimated in two dimensions. Each mirror is furthermore coa

NanoTube N3

The Excillum NanoTube N3 is based on advanced electron optics and the latest tungsten-diamond transmission target technology. Automatic e-beam focusing and astigmatism correction ensures that the smal

EIGER2 X/XE CdTe Series

DECTRIS EIGER2® X/XE CdTe photon-counting detectors provide high quantum efficiency for hard X-ray energies up to 100 keV, with a spatial resolution of 75 µm. Their cadmium-telluride sensor, which is 750 µm thick, brings all the advantages of EIGER2 X-ray detectors to high-energy applications. A high frame rate up to 2,000 kHz; under 100 ns of effective dead time between exposures; and ideal counting statistics enabled by a sharp, single-pixel point-spread function guarantee outstanding performance and accurate data collection. Furthermore, these beamline detectors offer two independent energy thresholds that will enable you to suppress fluorescence background (with the lower threshold) while measuring the contribution of higher harmonics (with the upper threshold). EIGER2 X/XE CdTe detectors come in different geometries and performances, and with optional vacuum capability. DECTRIS’ dedicated Support and Commissioning team will help you minimize any downtime.

EIGER2 S Series

DECTRIS EIGER2® S photon-counting X-ray detectors are the perfect choice if your research requires large-area, high-resolution beamline detectors, but not the ultimate speed. Like all EIGER2 detectors, this camera with 75-µm pixels delivers data with the highest spatial resolution. It includes two independent energy thresholds for spectral sensitivity, a single-pixel point-spread function for ideal counting statistics, and fast image readout with a frame rate up to 1 kHz. Equipped with a silicon sensor that is 450 µm thick, EIGER2 S detectors cover X-ray energies between 6 and 40 keV. EIGER2 S detectors come in a variety of sizes. Their robustness, combined with excellent support, make EIGER2 S detectors the most reliable and future-proof tool for cost-conscious beamlines.

MYTHEN2 X Series

DECTRIS® MYTHEN2 strip detectors have transformed high-resolution X-ray diffraction, scattering, and spectroscopy measurements by giving them another dimension: time. Renowned for its narrow strip and sharp point-spread function, MYTHEN2 X introduces a 1,000-Hz frame rate with a 24-bit dynamic range for any number of modules. This opens up new domains of time-resolved and in situ studies. The Detector Control System 4 (DCS4), with electronic gating and an external trigger, allows for tailor-made multimodular solutions and full synchronization of the detector with other systems. The time dimension, however, does not compromise data quality or system flexibility: we guarantee noise-free detection even for long exposure times. Additionally, the modules’ optional vacuum compatibility opens up new possibilities for X-ray spectroscopy applications.

MYTHEN2 R Series

DECTRIS® MYTHEN2 strip detectors bring synchrotron-like detection to the lab for all X-ray diffraction, scattering, and spectroscopy techniques. Their radiation hardness and maintenance-free operation make these detectors the perfect choice for academic research, multi-purpose service laboratories, portable diffractometers, and industrial sites that employ Good Manufacturing Practice (GMP) and Good Laboratory Practice (GLP) rules. MYTHEN2 R offers the narrowest strip width (50 μm) on the market, providing unprecedented signal resolution. Single-photon counting eliminates dark current and readout noise while delivering superior data. MYTHEN2 R detectors also combine noise-free performance with high quantum efficiency for the widest X-ray energy range: from Ti to Ag. This unique combination of features will help you make the most of weak laboratory sources by maximizing the signal-to-noise ratio and minimizing measurement and data processing times.

ARINA Detector

DECTRIS ARINA® retractable, electron-counting detector was specifically developed for 4D STEM applications. Featuring a new ASIC, it combines an extreme speed of up to 120,000 frames per second with a high dynamic range and noise-free readout, thus enabling high-quality data acquisition at the native speed of a conventional STEM measurement. Thanks to DECTRIS’ hybrid-pixel technology, ARINA can employ different sensor materials and perform optimally in the whole energy range of 30-300 keV. DECTRIS ARINA fits the bill for a broad spectrum of 4D STEM applications with dwell times below 10 μs, from crystalline-phases and orientation mapping to ptychography - including flexible STEM images reconstruction with virtual detectors.

QUARDO Detector

Based on hybrid-pixel technology, QUADRO is the first direct electron detector to be released by DECTRIS. It incorporates our signature instant retrigger, continuous readout, and noise-free acquisition. Even at high count rate (up to 10 million el/s/pix), DECTRIS QUADRO® detector is able to count every single electron, and thus assures more accurate data collection. Thanks to QUADRO’s exceptionally high dynamic range, your experimental setup will no longer require a beam stopper, and this will allow you to obtain uninterrupted diffraction patterns. This characteristic, combined with QUADRO detector’s speed and sensitivity, make it a game-changer for techniques such as Micro-Electron Diffraction (microED), electron imaging, strain imaging, and ptychography.

ELA Detector

DECTRIS ELA® electron-counting detector offers best-in-class performance in terms of detector noise, frame rate, and dynamic range. It can handle a probe current well over 100 pA, and it simultaneously captures weak and intense reflections to enable advanced diffraction and imaging studies. In addition, it allows for fast elemental mapping in one go, which is especially crucial when working with beam-sensitive materials. ELA hybrid-pixel detector is specifically optimized for Electron Energy Loss Spectroscopy (EELS) and Four-Dimensional Scanning Transmission Electron Microscopy (4D STEM).

SINGLA Detector

DECTRIS SINGLA® detector is a hybrid-pixel electron-counting camera optimized for Life Science applications. With a sensitive area of roughly 1,000 x 1,000-pixels, it is suitable for Cryo-Electron Microscopy (cryoEM) and Micro-Electron Diffraction (microED) applications. Experiments in single-particle analysis and cryo-electron tomography also benefit greatly from this detector’s speed. In addition, SINGLA detector’s fast readout speed (exceeding 2,000 frames per second), combined with its superior dynamic range, make it the ideal detector for small-molecule and 3D micro-crystallography. The detector is bottom-mounted and compatible with JEOL and Thermo Fisher Scientific Transmission Electron Microscopes (TEM).

Alloy Analyzer

For quality control, material classification, alloy identification, safety prevention, accident investigation and other field applications to provide alloy identification, rapid analysis of metal comp

Precious Analyzer

TrueX Precious Metals analyzer can nondestructively analyze element content in gold, silver and platinum group metals, as well as non-precious alloy metals and gold-plated samples.

Soil Heavy Metal Analyzer

LANScientific TrueX handheld soil heavy metals analyzer, portable light, just one key operation, can be for a variety of soil and sediment samples (tested can be solid, dust, powder, solid, debris, mu

Car Catalyst Analyzer

TrueX handheld car catalyst analyzer can be used to accurately measure platinum, palladium, rhodium and other elements in terraditional catalytic converters, providing rapid material composition analy

Ternary Battery Analyzer

TrueX TCB Ternary Battery Analyzer is LANScientific Co., LTD., combined with market demand, combined with electronics, microelectronics, semiconductor and several technologies such as computer softwar

RoHS Analyzer

The TrueX RoHS analyzer can be used to analyze the chemical composition of consumer products such as toys, clothing, footwear and electronic equipment in the field. It can quickly detect toxic element

Mineral Analyzer

The LANScientific TrueX Mineral Analyzer provides rapid and accurate elemental analysis results with little or no sample preparation at all stages of a mining operation, from grassroots exploration an

TrueX Handheld XRF Analyzer

TrueX handheld XRF analyzer is a powerful handheld XRF equipment launched by our company, featuring fast detection, ruggedness and small convenience. It can help users obtain laboratory - comparable r

Oil Analyzer

PeDX OIL is a portable XRF analyzer that provides sulfur analysis methods for the energy industry. It can analysis of lubricating oil, diesel fuel, kerosene, jet fuel, other distillation oil, volatile

Consumer Goods Analyzer

The PeDX CSA halogen-free analyzer can quickly and efficiently detect lead Pb, Cd, As, Hg, Cr and other toxic metals in consumer products such As toys, clothing and electronic equipment in compliance

Precious Metal Analyzer

The PeDX GOLD Precious Metal Analyzer has become a widely used, popular and reliable method for determining the elemental composition and purity of precious metals. Compared with other testing methods

PeDX Portable XRF Analyzer

PeDX is a portable X-ray fluorescence (XRF) analyzer designed by LANScientific according to the analysis needs of users. It has the advantages of portability, fast analysis speed, good stability and h

ScopeX Benchtop XRF Analyzer

The ScopeX desktop XRF analyzer is equipped with highly intelligent software and high-quality hardware, featuring a wide linear range, fast analysis, good reproducibility, and high accuracy.

RoHS Analyzer

The ScopeX CSA Consumable Analyzer is an integrated halogen-free X-ray fluorescence analyzer designed for RoHS/ELV restricted screening and analysis of hazardous elements.

Precious Metal Analyzer

The ScopeX GOLD Precious Metal Analyzer provides rapid and easy determination of Au, Ag, Pt, Pd and rare precious metals such as Os. Equipped with a variety of collimators and oversized sample chambe

Copper Alloy Analyzer

ScopeX Copper Alloy Analyzer is an X-ray fluorescence analyzer designed for rapid analysis and identification of copper alloys. It has the advantages xof high accuracy, wide range of analyzable elemen

Coal ASH Analyzer

ScopeX ASH analyzer is designed for coal ash composition analysis in coking enterprises. Equipped with intelligent software and high-quality hardware, the ScopeX ASH ASH analyzer features wide linear

Food Heavy Metal Analyzer

YANG 700F food heavy metal rapid analyzer is an XRF analytical instrument specially launched in the field of food security, used for rapid detection of cadmium, lead, mercury and other heavy metal ele

Soil Heavy Metal Analyzer

YANG XRF spectrometer is a new generation of XRF analytical instrument launched by LANScientific fic. Its blend of many years of XRF experience, crystal grating spectrometer technology and high intell

Ultra-low sulfur oil analyzer

Yang OIL Ultra-low sulfur OIL analyzer is an XRF analysis instrument specially designed for OIL detection by LANScientific Co., LTD. It integrates wave acoustic multi-year XRF research and development

SHINE Mineral & Rocks Edition

SHINE portable X-ray diffractometer (Mineral & Rocks Edition) is a portable X-ray diffractometer specially developed for mineral phase analysis in the field. It integrates XRD, XRF and computer softwa

SHINE Metal Corrosion Edition

SHINE portable X-ray diffractometer (Mineral & Rocks Edition) is a portable X-ray diffractometer specially developed for minBasic principles of X-ray diffraction: When a beam of monochromatic X ray in

SHINE Research Edition

SHINE portable X-ray diffractometer is a portable X-ray diffractometer independently developed by LANScientific with the combination of XRD, XRF and computer software technologies.The samples by X-ray

SHINE Soil Edition

SHINE portable X-ray diffractometer is a portable X-ray diffractometer independently developed by LANScientific with the combination of XRD, XRF and computer software technologies.The samples by X-ray

FRINGE CLASS

FRINGE CLASS Benchtop X-ray diffractometer is a desktop X-ray diffractometer independently developed by LANScientific Co., LTD., which integrates XRD, XRF, computer software, and other technologies.

FRINGE

FRINGE Benchtop X-ray diffractometer is a desktop X-ray diffractometer independently developed by LANScientific Co., LTD., which integrates XRD, XRF, computer software, and other technologies.

FRINGE EV

FRINGE EV benchtop X-ray diffractometer in the X-ray beam through the sola slit, divergent slit irradiation on the sample, the sample stage is located in the center of the goniometer, based on the ref

TrueX COAT Coating Analyzer

TrueX COAT coating thickness measuring instrument is a hand-held XRF instrument with excellent performance designed by LANScientific Co., LTD., relying on years of XRF technology research and developm

ScopeX COAT Coating Analyzer

The ScopeX COAT coating analyzer is suitable for multilayer coating thickness measurement and material analysis, providing quantitative and qualitative analysis of the elemental composition of samples

PeDX COAT Coating Analyzer

Without sample preparation, PeDX COAT analyzer can be directly used for multi-layer coating thickness measurement and material analysis, and can also be used for quantitative and qualitative analysis

INSIGHT五金衛浴版(INSIGHT Ironware Application Plant)

不同鍍層產品的質量檢查的內容因零件和鍍層而異，但鍍層的外觀、厚度、耐蝕性和與基體金屬的結合力是所有鍍層都必須檢查的內容，其中鍍層的厚度是鍍件品質的最重要保證因素。

INSIGHT Universal Version For Small Parts

The INSIGHT coating analyzer uses a micro-focusing X-ray tube to collect most of the rays from the X-ray source and focus them into a micro-beam spot, which is irradiated at the sample position, so as

INSIGHT Electronic Application Scopes

As the main process to ensure the reliability and stability of product quality in the electronics industry, the thickness of the coating is the most important guarantee factor for product quality.

RA200 Handheld Raman Spectrometer

RA200 is a handheld Raman spectrometer launched by LANScientific. It adopts spatially coupled optics, electronics design, and stoichiometry algorithm integrated with science, with easy operation and e

Portable XRF & Raman Spectrometer

Portable X-ray fluorescence - Raman instrument is an integrated analysis instrument designed by LANScientific for user needs. It is a combination of XRF technology, Raman spectroscopy technology and s

Atmospheric Heavy Metal On-line Monitor

AOA 200 Atmospheric heavy metal online analyzer is an online heavy metal continuous monitor independently developed by LANScientific fusion of X-ray fluorescence nondestructive testing technology, β -

Miniature On-line Atmospheric Heavy Metal Monitor

GaOA tiny atmospheric heavy metal on-line analyzer is LANScientific co., LTD., fusion X fluorescence nondestructive testing technology, automatic air particulates enrichment technology, independent re

Continuous Monitoring System for Heavy Metals in Flue Gas

AOA 200CEMS flue gas heavy metal online monitoring system is a set of solutions designed by LANScientific for the rapid online analysis of heavy metal pollutants in flue gas. The instrument applies th

Pollutant Discharge Monitor

SPAS(Sulfur Auto System) ship pollutant discharge monitor is a high-performance online monitoring equipment developed and produced by LANScientific based on years of experience in atmospheric environm

SpeBOX-1光譜盒子SpeBOX-1 Spectrum Box

浪聲SpeboX-1光譜盒子是浪聲科學憑藉多年的XRF技術研發經驗，結合了光電子、微電子和電腦軟體等多項技術，設計出的一款檢測分選儀器。

XLA-1-1250 Ultrasonic Actuator (Encoder Resolution: 1250 nm)

XLA-1 Series: Driving Force: 1 Newton Encoder Resolution: 1250 nm Rod Length: 20 ~ 320 mm Travel Range: 5 ~ 305 mm Motion Controller: XD-A, XD-M

XLA-1-312 Ultrasonic Actuator (Encoder Resolution: 312 nm)

XLA-1 Series: Driving Force: 1 Newton Encoder Resolution: 312 nm Rod Length: 20 ~ 320 mm Travel Range: 5 ~ 305 mm Motion Controller: XD-A, XD-M

XLA-1-78 Ultrasonic Actuator (Encoder Resolution: 78 nm)

XLA-1 Series: Driving Force: 1 Newton Encoder Resolution: 78 nm Rod Length: 20 ~ 320 mm Travel Range: 5 ~ 305 mm Motion Controller: XD-A, XD-M

XLA-1-OPEN Ultrasonic Actuator (open loop control)

XLA-1 Series: Driving Force: 1 Newton Encoder Resolution: open loop control with integrated controller Rod Length: 20 ~ 320 mm Travel Range: 5 ~ 305 mm

XLA-3-1250 Ultrasonic Actuator (Encoder Resolution: 1250 nm)

XLA-3 Series: Driving Force: 3 Newton Encoder Resolution: 1250 nm Rod Length: 45 ~ 325 mm Travel Range: 15 ~ 295 mm Motion Controller: XD-A, XD-M

XLA-3-312 Ultrasonic Actuator (Encoder Resolution: 312 nm)

XLA-3 Series: Driving Force: 3 Newton Encoder Resolution: 312 nm Rod Length: 45 ~ 325 mm Travel Range: 15 ~ 295 mm Motion Controller: XD-A, XD-M

XLA-3-78 Ultrasonic Actuator (Encoder Resolution: 78 nm)

XLA-3 Series: Driving Force: 3 Newton Encoder Resolution: 78 nm Rod Length: 45 ~ 325 mm Travel Range: 15 ~ 295 mm Motion Controller: XD-A, XD-M

XLA-3-78 Ultrasonic Actuator (open loop control)

XLA-3 Series: Driving Force: 3 Newton Encoder Resolution: open loop control with integrated controller Rod Length: 45 ~ 325 mm Travel Range: 15 ~ 295 mm Motion Controller: XD-A, XD-M

XD-A Controller (PCB Only)

The XD-A controller is a compact controller PCB, especially made for the closed-loop version of the XLA micro-actuator.

Teresa Nano-CT SGS-E160NCT-150NM

The world best spatial resolution down to 150 nm

Capillary for X-ray analysis Mark tube (Lindeman glass)

Material: Lindeman glass Quantity: 1 box (pack of 25) Length: 80mm Thickness: 0.01mm Melting point: 585℃