Diffraction

X-ray diffraction is a general non-destructive analytical method to reveal inner details of crystal structure with long range ordering, chemical composition of atoms, and its physical properties of materials.

Specular X-ray Diffraction (θ-2θ scan)

Specular X-ray Diffraction (θ-2θ scan)

Symmetrical X-ray diffraction is applicable for detecting single crystal structures or epitaxial thin films. Through the analysis of diffraction peak width, information such as thickness, stress/strain, and defects can be obtained.
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Grazing-Incident X-ray Diffraction (GIXRD/2θ-scan)

Grazing-Incident X-ray Diffraction (GIXRD/2θ-scan)

GIXRD at 2θ-scan mode, provides the structural information or preferred orientation of polycrystalline, powder, and polymer layers.
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Room-Temperature Powder X-ray Diffraction (RT-PXRD)

Room-Temperature Powder X-ray Diffraction (RT-PXRD)

Determine unknown crystal structure by Rietveld refinement. Study mixture phase and crystal size distribution.
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Temperature-Dependent Powder X-ray Diffraction (TD-PXRD)

Temperature-Dependent Powder X-ray Diffraction (TD-PXRD)

Study the phase transition temperature of materials, or the strain/stress, dislocation, and segregation as a function of temperature.
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