X-ray diffraction is a general non-destructive analytical method to reveal inner details of crystal structure with long range ordering, chemical composition of atoms, and its physical properties of materials.
Specular X-ray Diffraction (θ-2θ scan)
Symmetrical X-ray diffraction is applicable for detecting single crystal structures or epitaxial thin films. Through the analysis of diffraction peak width, information such as thickness, stress/strain, and defects can be obtained.
Grazing-Incident X-ray Diffraction (GIXRD/2θ-scan)
GIXRD at 2θ-scan mode, provide the structural information or prefer orientation of polycrystalline, powder and polymer layers.
Room-Temperature Powder X-ray Diffraction (RT-PXRD)
Determine unknown crystal structure by Rietveld refinement. Study mixture phase and crystal size distribution.