Nano-Beam X-Ray Fluroescence Mapping (2D n-XRF)
80 nm spatial resolution to characterized the local elements distribution and more bulk sensitivity compare to SEM. No special pre-condition requirements.
Nano-Beam X-Ray Nanodiffraction (2D n-XRD)
Laue diffraction with 80 nm spatial resolution to characterized the local deformation, stress and strain partitioning, fatigue, grain growth, and recrystallization.
Nano-Beam X-Ray Absorption Mapping (2D n-XAS)
Absorption mapping give better understand the inhomogeneous distribution (edge-shift) of materials under different treatment conditions.