Spectroscopy

X-ray Spectroscopy

Hard X-ray Extended Absorption Fine Structure (HX-EXAFS, 5~30 keV)

Hard X-ray Extended Absorption Fine Structure (HX-EXAFS, 5~30 keV)

The Extended X-ray Absorption Fine Structure (EXAFS) technique utilizes oscillations in the X-ray absorption spectrum beyond the absorption edge to observe the fine structure and electronic configurations of different types of atoms in a material. It is an important tool for studying the microscopic properties of materials, primarily focusing on the local atomic structure to determine distances, types, and numbers of neighboring atoms.
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In-Situ/In-Operando HX-XAS (Electrochemical; IS-HX-XAS, 5~22 keV)

In-Situ/In-Operando HX-XAS (Electrochemical; IS-HX-XAS, 5~22 keV)

In-Situ HX-NEXAFS elucidates the chemical nature of electrocatalysts under reaction conditions.
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Japan High Concentration EXAFS Batch Service (5~22 keV, > 5wt%)

Japan High Concentration EXAFS Batch Service (5~22 keV, > 5wt%)

Extending the fine structure of X-ray absorption and using X-ray spectrum oscillations that exceed the absorption boundary energy to observe the fine structures and electronic configurations between different types of atoms in materials is an important tool for studying the microscopic nature of matter. It mainly measures the regional structure of atoms and knows the distance, type, and number between atoms and neighboring atoms.
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Hard X-ray Extended Absorption Fine Structure (HX-EXAFS, 10~30 keV)

Hard X-ray Extended Absorption Fine Structure (HX-EXAFS, 10~30 keV)

Extending the fine structure of X-ray absorption and using X-ray spectrum oscillations that exceed the absorption boundary energy to observe the fine structures and electronic configurations between different types of atoms in materials is an important tool for studying the microscopic nature of matter. It mainly measures the regional structure of atoms and knows the distance, type, and number between atoms and neighboring atoms.
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Tender X-ray Near-Edge Absorption Fine Structure (TX-NEXAFS, 1.75~6 keV)

Tender X-ray Near-Edge Absorption Fine Structure (TX-NEXAFS, 1.75~6 keV)

X-ray near-edge absorption spectroscopy can be used to detect the electronic configuration of specific atoms in materials and learn the crystallographic symmetry of the atoms' positions. The near-edge structure of the energy spectrum will change due to the symmetry, oxidation number of the central atom, and the surrounding bonded atoms.
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Tender X-ray Extended Absorption Fine Structure (TX-EXAFS, 1.75~6 keV)

Tender X-ray Extended Absorption Fine Structure (TX-EXAFS, 1.75~6 keV)

Extending the fine structure of X-ray absorption and using X-ray spectrum oscillations that exceed the absorption boundary energy to observe the fine structures and electronic configurations between different types of atoms in materials is an important tool for studying the microscopic nature of matter. It mainly measures the regional structure of atoms and knows the distance, type, and number between atoms and neighboring atoms.
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Soft X-ray Near-Edge Absorption Fine Structure (SX-NEXAFS, 0.15~2 keV)

Soft X-ray Near-Edge Absorption Fine Structure (SX-NEXAFS, 0.15~2 keV)

XANES gives information about the valence state, energy bandwidth and bond angles.
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Soft X-ray Extended Absorption Fine Structure (SX-EXAFS, 0.15~2 keV)

Soft X-ray Extended Absorption Fine Structure (SX-EXAFS, 0.15~2 keV)

Extending the fine structure of X-ray absorption and using X-ray spectrum oscillations that exceed the absorption boundary energy to observe the fine structures and electronic configurations between different types of atoms in materials is an important tool for studying the microscopic nature of matter. It mainly measures the regional structure of atoms and knows the distance, type, and number between atoms and neighboring atoms.
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Soft X-ray Photoelectron Spectroscopy (SX-XPS, 0.15~2 keV)

Soft X-ray Photoelectron Spectroscopy (SX-XPS, 0.15~2 keV)

XPS can identify the elements within a material and its chemical state. Synchrotron-XPS can profiling depth via changing different incident x-ray energy.
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Tender X-ray Photoelectron Spectroscopy (TX-XPS, 1.75~6 keV)

Tender X-ray Photoelectron Spectroscopy (TX-XPS, 1.75~6 keV)

XPS can identify the elements within a material and its chemical state. Synchrotron-XPS can profiling depth via changing different incident x-ray energy.
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Data Analysis of XAS

Data Analysis of XAS

EXAFS yields information about the interatomic distances, near neighbor coordination numbers, and lattice dynamics.
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