Symmetrical X-ray diffraction is applicable for detecting single crystal structures or epitaxial thin films. Through the analysis of diffraction peak width, information such as thickness, stress/strain, and defects can be obtained.
GIXRD at 2θ-scan mode, provide the structural information or prefer orientation of polycrystalline, powder and polymer layers.
Determine unknown crystal structure by Rietveld refinement. Study mixture phase and crystal size distribution.
Study the phase transition temperature of materials, or the strain/stress, dislocation, segregation as function of temperature.
80 nm spatial resolution to characterized the local elements distribution and more bulk sensitivity compare to SEM. No special pre-condition requirements.
Laue diffraction with 80 nm spatial resolution to characterized the local deformation, stress and strain partitioning, fatigue, grain growth, and recrystallization.
Absorption mapping give better understand the inhomogeneous distribution (edge-shift) of materials under different treatment conditions.
nano-TXM used capillary to achieved 60 nm spatial resolution which able to perform 2D absorption contrast imaging and 3D computed tomography. This technology were widely use in soft- and bio-materials
GIWAXS is a structural measurement technique to collect wide-angle scattering with grazing-incidence to cover large sample area for average information. These large values of q correspond to
XANES gives information about the valence state, energy bandwidth and bond angles.
HX-EXAFS yields information about the interatomic distances, near neighbor coordination numbers, and lattice dynamics.
In-Situ HX-NEXAFS elucidates the chemical nature of electrocatalysts under reaction conditions.
