Name: Soft X-ray Near-Edge Absorption Fine Structure (SX-NEXAFS, 0.15~2 keV)
Brand: Soft X-ray Near-Edge Absorption Fine Structure (SX-NEXAFS, 0.15~2 keV)
SKU: SUPER LEX

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Soft X-ray Near-Edge Absorption Fine Structure (SX-NEXAFS, 0.15~2 keV)

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Sample Name *

Sample Information or Chemical Formula (Ex. V2O5:Si) *

Target Element Concentration (Ex. V/55wt%) *

Other Elements Concentration (Ex. Cr/44wt%; Mn/1wt%) *

MSDS No. (Compounds or Precursor)

Basic Fee*

This basic fee included sample handling, transfer and pumping down time.

Measurement Element*

Choose Your Measurement Element

Concentration Range*

Target Element Concentration (in weight percentage)

Measurement Points of Incident Angle*

We defined the angle as 0 degree when x-ray beams normal incident to sample. Please input the total measurement numbers of angle here and write all exactly angles in message column below. We accepted the incident angle ranging from 0 to 80 degree.

Sample Form*

Select your sample form.

Measurement Method*

Select How to Measure the Spectrum. TEY: for good conductor or high concentration; PEY: for poor conductor or low concentration sample.

Delivery Time of Data*

Data available time (from the date of SGService received the sample, noted on system notification letter)

Return Sample*

We will return your sample via FedEx/DHL/UPS/EMS when "Yes". Just select once for one sample, we will return entire samples in the same order number to your member registered address.

Message

Please Noted Your Special Requirements Here (Ex. Sample Handling Condition, Different Return Address of Sample)

PriceTWD 8,000

DiscountTWD -0

Total PriceTWD 8000

Go to get your member discount !

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