XRD is a nondestructive method to provides information on crystal structure, phase, orientation or texture, grain size, crystallinity, strain, and crystal defects.
The world best nano-focus X-ray source together with CdTe detectors provided the best ever resolution at high energy for industrial application.
Conduct image analysis on the three-dimensional data files measured by customers at SGService or other companies to obtain information such as volume, porosity, defect analysis, critical dimensions and internal feature analysis.
X-ray Photoelectron Spectroscopy (XPS), also known as Electron Spectroscopy for Chemical Analysis (ESCA), mainly used to obtain chemical details of the surface of condense materials.
