Design & Manufacture of Multifunctional Nanoscale Computed Tomography System

Strain and Defect Analyzer of SiC Ingot/Wafer

Using X-ray NDT method to obtain the orientation, strain/stress and BPD/TED/TSD defects of SiC ingots and wafers in very short inspection time.

MetalJet C2

The Excillum MetalJet C2 offers an attractive, cost effective version of the metal-jet X-ray source technology with simplified electron optics producing a round electron beam focus. The Excillum Meta

MetalJet D2+

The Excillum MetalJet D2+ features our unique metal-jet anode technology and advanced electron optics. Achieving significantly higher brightness and smaller spot sizes than any other available microfo

MetalJet D2+ 160 kV

MetalJet D2+ 160 kV

MetalJet E1+ 160 kV

At 1000 watts, the new Excillum MetalJet E1+ delivers 17 times more X-ray flux across a broad spectral range compared to a 30 W conventional tungsten-solid-anode microfocus source with the same 30 µm

Montel Multilayer Optics

A Montel optic is two mirrors shaped in one plane each placed next to each other so that X-rays reflected from both surfaces are focused or collimated in two dimensions. Each mirror is furthermore coa

NanoTube N3

The Excillum NanoTube N3 is based on advanced electron optics and the latest tungsten-diamond transmission target technology. Automatic e-beam focusing and astigmatism correction ensures that the smal

EIGER2 X/XE Series

DECTRIS EIGER2® X/XE photon-counting X-ray detectors translate the latest developments in hybrid-pixel technology into outstanding performance. Thanks to their high frame rate up to 2,000 kHz, loss-free detection with under 100 ns of effective dead time between exposures, and ideal counting statistics enabled by a single-pixel point-spread function, these detectors will allow you to collect the most accurate data possible at your beamline. With its silicon sensor 450 µm thick, EIGER2 X/XE covers a wide range of X-ray energies between 6-40 keV. Coming in different geometries and speeds, and with optional vacuum capability, DECTRIS EIGER2® X/XE detectors fit the requirements of almost any experimental setup. Utilize the capabilities of your beamline and enjoy full support from the whole DECTRIS team.

EIGER2 X/XE CdTe Series

DECTRIS EIGER2® X/XE CdTe photon-counting detectors provide high quantum efficiency for hard X-ray energies up to 100 keV, with a spatial resolution of 75 µm. Their cadmium-telluride sensor, which is 750 µm thick, brings all the advantages of EIGER2 X-ray detectors to high-energy applications. A high frame rate up to 2,000 kHz; under 100 ns of effective dead time between exposures; and ideal counting statistics enabled by a sharp, single-pixel point-spread function guarantee outstanding performance and accurate data collection. Furthermore, these beamline detectors offer two independent energy thresholds that will enable you to suppress fluorescence background (with the lower threshold) while measuring the contribution of higher harmonics (with the upper threshold). EIGER2 X/XE CdTe detectors come in different geometries and performances, and with optional vacuum capability. DECTRIS’ dedicated Support and Commissioning team will help you minimize any downtime.

EIGER2 S Series

DECTRIS EIGER2® S photon-counting X-ray detectors are the perfect choice if your research requires large-area, high-resolution beamline detectors, but not the ultimate speed. Like all EIGER2 detectors, this camera with 75-µm pixels delivers data with the highest spatial resolution. It includes two independent energy thresholds for spectral sensitivity, a single-pixel point-spread function for ideal counting statistics, and fast image readout with a frame rate up to 1 kHz. Equipped with a silicon sensor that is 450 µm thick, EIGER2 S detectors cover X-ray energies between 6 and 40 keV. EIGER2 S detectors come in a variety of sizes. Their robustness, combined with excellent support, make EIGER2 S detectors the most reliable and future-proof tool for cost-conscious beamlines.

EIGER2 R Series

DECTRIS EIGER2® R X-ray detectors for laboratory applications incorporate all the state-of-the art features of hybrid-pixel technology. The two energy-discriminating thresholds allow for extensive background suppression and improve the signal-to-noise ratio, in particular for weak signals and long exposure times. The detectors’ superior count-rate performance, high dynamic range, and simultaneous read/write with zero dead time enable accurate measurements of even the highest intensities. Thanks to the detectors’ optional vacuum compatibility, absorption and scattering from air and windows can be minimized. 75-µm pixels, in combination with direct detection, achieve high spatial and angular resolution and give you the benefit of fine sampling with wide coverage of reciprocal space. DECTRIS EIGER2® R’s many geometries and room-temperature operation, with dedicated support from us, make it an easy-to-integrate and easy-to-operate X-ray detector for any analytical instrument.