Nano-Beam X-Ray Absorption Mapping (2D n-XAS)

Nano-Beam X-Ray Absorption Mapping (2D n-XAS) is a technique for characterizing materials on the nanoscale. It utilizes a focused X-ray beam to investigate tiny regions within a sample, capturing two-dimensional absorption maps that provide detailed insights into the electronic and chemical properties of materials at the nanoscale. This advanced analytical method finds its place at the intersection of nanoscience and spectroscopy, offering a powerful tool for unraveling the unique characteristics of nanomaterials.


Positioned as a versatile technology, 2D n-XAS holds promise across various fields, including catalysis, energy materials, and environmental science. Its ability to delve into nanoscale electronic and chemical properties opens doors for applications in technological advancements. As 2D n-XAS continues to evolve, it is poised to revolutionize our understanding and manipulation of nanomaterial properties, paving the way for innovations in diverse scientific and technological domains.


This valence electron distribution is coming from NEXAFS 2D scanning with a 80nm nano focusing X-ray @TPS-21A.

Nano-Beam X-Ray Absorption Mapping (2D n-XAS)

2-D Absorption Image - Energy Shift of Ni-element


Experimental Details




NCM materials (foil)

Scan Size (μm)

 3.5 x 3.5

Target Element

Ni K-edge, 8333 eV

Scan Step (μm)


Spectra Energy Step (eV)


Spectrum Range (eV)

8325 ~ 8365


Nano-Beam X-Ray Absorption Mapping (2D n-XAS)

This image shows that the near-edge absorption is non-uniform, and the valence number of Ni can be identified as being between 0 and 1.