Specular X-ray Diffraction (θ-2θ scan)
Symmetrical X-ray diffraction is applicable for detecting single crystal structures or epitaxial thin films. Through the analysis of diffraction peak width, information such as thickness, stress/strain, and defects can be obtained.
Grazing-Incident X-ray Diffraction (GIXRD/2θ-scan)
GIXRD at 2θ-scan mode, provide the structural information or prefer orientation of polycrystalline, powder and polymer layers.
Room-Temperature Powder X-ray Diffraction (RT-PXRD)
Determine unknown crystal structure by Rietveld refinement. Study mixture phase and crystal size distribution.
Temperature-Dependent X-ray Powder Diffraction (Heating)
Study the phase transition temperature of materials, or the strain/stress, dislocation, segregation as function of temperature.
Nano-Beam X-Ray Fluroescence Mapping (2D n-XRF)
80 nm spatial resolution to characterized the local elements distribution and more bulk sensitivity compare to SEM. No special pre-condition requirements.
Nano-Beam X-Ray Nanodiffraction (2D n-XRD)
Laue diffraction with 80 nm spatial resolution to characterized the local deformation, stress and strain partitioning, fatigue, grain growth, and recrystallization.
Nano-Beam X-Ray Absorption Mapping (2D n-XAS)
Absorption mapping give better understand the inhomogeneous distribution (edge-shift) of materials under different treatment conditions.
Nanoscale Transmission X-ray Microscopy (2D/3D n-TXM)
nano-TXM used capillary to achieved 60 nm spatial resolution which able to perform 2D absorption contrast imaging and 3D computed tomography. This technology were widely use in soft- and bio-materials
Grazing-Incident Wide-Angle X-Ray Scattering (GIWAXS)
GIWAXS is a structural measurement technique to collect wide-angle scattering with grazing-incidence to cover large sample area for average information. These large values of q correspond to
Hard X-ray Near Edge Absorption Fine Structure (HX-NEXAFS, 5~27 keV)
XANES gives information about the valence state, energy bandwidth and bond angles.
Hard X-ray Extended Absorption Fine Structure (HX-EXAFS, 5~27 keV)
HX-EXAFS yields information about the interatomic distances, near neighbor coordination numbers, and lattice dynamics.