Specular X-ray Diffraction (θ-2θ scan)

Specular X-ray Diffraction in the θ-2θ scan configuration is a technique employed for the detailed analysis of the crystal structure in materials. By directing monochromatic X-rays onto a crystalline sample at a specific incident angle (θ), the interaction with electrons in the crystal lattice produces diffracted X-rays, which are then detected at an angle (2θ) relative to the incident beam. Governed by Bragg's Law, this process generates a diffraction pattern that serves as a fingerprint of the material's crystal lattice parameters, revealing essential details about the spacing between crystal planes.


This method, rooted in the principles of crystallography, enables researchers to unravel valuable information regarding the crystal structure, phase composition, and preferred orientation of the material. Specular X-ray Diffraction in the θ-2θ scan configuration finds widespread applications in diverse scientific fields such as materials science, solid-state physics, and structural biology. Its non-destructive nature makes it an invaluable tool for understanding the complex and intricate properties of crystalline materials at the atomic level.