SGService is pleased to announce our participation in SEMICON 2026, and we warmly invite industry partners and professionals to visit our booth.

At this exhibition, we will present our latest X-ray inspection and metrology solutions for advanced semiconductor applications, including:

• MUST (Multi-channel Ultra-fast Scanning Tomography) ultra-fast 3D CT
• X-ray Topography (XRT) for crystal defect and strain analysis
• CD-Laue for GAA critical dimension metrology
• Inspection solutions for advanced packaging (HBM / CoWoS / TSV / μ-bump)

SGService is committed to bringing synchrotron-grade X-ray capabilities into lab and fab environments, enabling:

• Inline / near-inline high-throughput inspection
• High resolution with ultra-low dose
• AI-enhanced reconstruction and defect detection

Event Information

• Event: SEMICON 2026
• Booth: I3216

We look forward to welcoming you and exploring future collaboration opportunities.