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SGService Redefines Inline X-ray Inspection for Advanced Semiconductor Manufacturing

As semiconductor packaging evolves into ever more complex architectures—HBM, chiplets, and advanced 3D integration—the industry faces a critical bottleneck:

Inspection speed can no longer keep up with manufacturing.

Traditional X-ray CT systems force a compromise between throughput and full 3D visibility—limiting their adoption in real production environments.

SGService is changing that.

From Laboratory Technology to Production Infrastructure

Building on years of synchrotron-based X-ray expertise, SGService introduces a new paradigm:

MUST (Multi-channel Ultra-fast Scanning Technology)
A platform designed not for research—but for real semiconductor production lines.

  • Sub-second CT imaging (~0.3 sec per scan) 
  • Over 100× throughput improvement vs conventional CT 
  • Inline / at-line integration ready
  • AI-powered reconstruction with near real-time results

This is not an incremental upgrade.
It is a fundamental shift from offline inspection → inline metrology infrastructure.

Unlocking the Next Phase of Semiconductor Yield

MUST enables manufacturers to finally achieve:

  • Full 3D inspection at production speed
  • Detection of critical defects (TSV voids, micro-bumps, hybrid bonding, RDL failures)
  • Low-dose inspection compatible with advanced packaging
  • Real-time feedback for yield optimization

For the first time, speed and complete 3D information are no longer a trade-off.

Why This Matters to the Industry—and Investors

The semiconductor industry is entering an era where:

  • Advanced packaging is becoming the performance driver
  • Yield loss costs are exponentially increasing
  • Inline inspection is shifting from “nice-to-have” to mission-critical infrastructure

SGService is positioned at the center of this transition.

We are not just building equipment—we are enabling:

→ A new inspection standard for next-generation fabs
→ A scalable platform for high-throughput 3D metrology
→ A bridge between synchrotron-grade capability and industrial deployment

A Platform, Not Just a Product

MUST is designed as a scalable ecosystem:

  • Multi-detector architecture for parallel imaging
  • AI-driven reconstruction and defect analytics
  • Expandable configurations for different production needs

This creates a long-term roadmap beyond a single system—
toward a family of high-performance X-ray inspection solutions.

Invitation to Collaborate

SGService is actively engaging with:

  • Leading semiconductor manufacturers
  • Advanced packaging innovators
  • Strategic partners and investors

to accelerate deployment of this next-generation inspection platform.

Join us in shaping the future of inline X-ray inspection.
Explore collaboration, pilot programs, and investment opportunities.

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