2D nano-X-ray fluorescence (n-XRF) analysis provides detailed elemental mapping and high-resolution imaging at the nanoscale, providing researchers and scientists with valuable insights into sample composition. 80 nm spatial resolution to characterize the distribution of local elements and more bulk sensitivity compared to SEM. There are no special precondition requirements.
Laue diffraction with 80 nm spatial resolution to characterize the local deformation, stress and strain partitioning, fatigue, grain growth, and recrystallization.
Absorption mapping give better understand the inhomogeneous distribution (edge-shift) of materials under different treatment conditions.
