X-ray Photoelectron Spectroscopy (In-house XPS, Depth Profiling)
Number of Elements per Sample*
Select how many elements you want to measure in one sample.
Size of Sample*
Select your sample size (LxWxH) in mm. For the powder sample please chooses "< 3x3x2", but there will be some limitations in the analysis process.
Depth Profiling test*
Select use Ar+ ions to perform surface etched or cleaning.
Charge Compensation of Sample*
Select charge compensation or not.
Etching Time of Depth Profiling on Each Layer*
Select the etching time of each layer during the depth profiling. (Unit: Sec)
Select the total measurement layers of depth profiling.
Delivery Time of Data*
Data available time (from the date of SGService received the sample, noted on system notification letter)
We will return your sample via FedEx/DHL/UPS/EMS when "Yes". Just select once for one sample, we will return entire samples in the same order number to your member registered address.
Please Noted Your Special Requirements Here (Ex. Sample Handling Condition, Different Return Address of Sample)