Tender X-ray Absorption

Tender X-ray Near-Edge Absorption Fine Structure (TX-NEXAFS, 1.75~6 keV)

Tender X-ray Near-Edge Absorption Fine Structure (TX-NEXAFS, 1.75~6 keV)

X-ray near-edge absorption spectroscopy can be used to detect the electronic configuration of specific atoms in materials and learn the crystallographic symmetry of the atoms' positions. The near-edge structure of the energy spectrum will change due to the symmetry, oxidation number of the central atom, and the surrounding bonded atoms.
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Tender X-ray Extended Absorption Fine Structure (TX-EXAFS, 1.75~6 keV)

Tender X-ray Extended Absorption Fine Structure (TX-EXAFS, 1.75~6 keV)

Extending the fine structure of X-ray absorption and using X-ray spectrum oscillations that exceed the absorption boundary energy to observe the fine structures and electronic configurations between different types of atoms in materials is an important tool for studying the microscopic nature of matter. It mainly measures the regional structure of atoms and knows the distance, type, and number between atoms and neighboring atoms.
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