Hard X-ray Absorption

Hard X-ray Extended Absorption Fine Structure (HX-EXAFS, 5~30 keV)

Hard X-ray Extended Absorption Fine Structure (HX-EXAFS, 5~30 keV)

The Extended X-ray Absorption Fine Structure (EXAFS) technique utilizes oscillations in the X-ray absorption spectrum beyond the absorption edge to observe the fine structure and electronic configurations of different types of atoms in a material. It is an important tool for studying the microscopic properties of materials, primarily focusing on the local atomic structure to determine distances, types, and numbers of neighboring atoms.
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In-Situ/In-Operando HX-XAS (Electrochemical; IS-HX-XAS, 5~22 keV)

In-Situ/In-Operando HX-XAS (Electrochemical; IS-HX-XAS, 5~22 keV)

In-Situ HX-NEXAFS elucidates the chemical nature of electrocatalysts under reaction conditions.
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Japan High Concentration EXAFS Batch Service (5~22 keV, > 5wt%)

Japan High Concentration EXAFS Batch Service (5~22 keV, > 5wt%)

Extending the fine structure of X-ray absorption and using X-ray spectrum oscillations that exceed the absorption boundary energy to observe the fine structures and electronic configurations between different types of atoms in materials is an important tool for studying the microscopic nature of matter. It mainly measures the regional structure of atoms and knows the distance, type, and number between atoms and neighboring atoms.
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Hard X-ray Extended Absorption Fine Structure (HX-EXAFS, 10~30 keV)

Hard X-ray Extended Absorption Fine Structure (HX-EXAFS, 10~30 keV)

Extending the fine structure of X-ray absorption and using X-ray spectrum oscillations that exceed the absorption boundary energy to observe the fine structures and electronic configurations between different types of atoms in materials is an important tool for studying the microscopic nature of matter. It mainly measures the regional structure of atoms and knows the distance, type, and number between atoms and neighboring atoms.
Detail Order
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