ELA 偵測器
Description
DECTRIS ELA® electron-counting detector offers best-in-class performance in terms of detector noise, frame rate, and dynamic range. It can handle a probe current well over 100 pA, and it simultaneously captures weak and intense reflections to enable advanced diffraction and imaging studies. In addition, it allows for fast elemental mapping in one go, which is especially crucial when working with beam-sensitive materials.
ELA hybrid-pixel detector is specifically optimized for Electron Energy Loss Spectroscopy (EELS) and Four-Dimensional Scanning Transmission Electron Microscopy (4D STEM).
ELA hybrid-pixel detector is specifically optimized for Electron Energy Loss Spectroscopy (EELS) and Four-Dimensional Scanning Transmission Electron Microscopy (4D STEM).
Specification
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- • Captures everything: thanks to its dead-time-free readout, ELA detector collects all the information your sample can deliver.
- • Fast: ELA detector’s high frame and count rates reduce experiment time significantly and allow for increased instrument throughput.
- • Easy: ELA detector’s Application Programming Interface (API) enables straightforward integration into any modern data pipeline or electron microscopy suite.
Detector Specifications*
|
Number of pixels (W x H) |
1,028 x 512 |
|---|---|
|
Active area (W x H) [mm² ] |
77.1 x 38.4 |
|
Pixel size (W x H) [µm² ] |
75 x 75 |
|
Sensor material |
Silicon (Si) |
|
Energy range [keV ] |
30 - 200 |
|
Frame rate (max.) [Hz ] |
2,250 (16-bit); 4,500 (8-bit) |
|
Frame rate (ROI, max.) [Hz ] |
9,000 (16-bit); 18,000 (8-bit) |
|
Count rate (max.) [el/s/pixel ] |
107 |
|
Detective Quantum Efficiency, DQE(0) |
0.9 at 100 kV, 0.8 at 200 kV |
|
Detector mounting |
On-axis, post spectrometer |
*All specifications are subject to change without notice.