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Synchrotron Analysis
Diffraction
Regular Diffraction
Thin-Film Diffraction
Grazing-Incident X-ray Diffraction (GIXRD/2θ-scan)
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Grazing-Incident X-ray Diffraction (GIXRD/2θ-scan)
Member Status
Sample Name
*
Sample Information or Chemical Formula (Ex. ZnO layer on Si)
*
Angle of Incidence
*
Beam Energy(Preset 12keV)
*
MSDS No. (Compounds or Precursor)
Sample Size
*
- Please Select -
< 1 x 1 cm
1 x 1 ~ 2 x 2 cm
> 2 x 2 cm
< 0.5 x 0.5 cm
The sample size will influence the signal intensity and collection time.
Sample Type
*
- Please Select -
Films on Substrate
Sheet
Powder
Basic time for preparation and alignment. The powder sample will pre-fix on silicon substrate.
Scan Range of Angle
*
- Please Select -
5 ~ 40 degree
Select the measurement angle range of 2θ-scan method.
Data Analysis
*
- Please Select -
Raw Data
Delivery Time of Data
*
- Please Select -
Standard (Within 30 Working Days)
Speed (Within 15 Working Days)
Express (Within 7 Working Days)
Data available time (from the date of SGService received the sample, noted on system notification letter)
Return Sample
*
- Please Select -
No (Disposal Fee)
Yes (ONLY for Taiwan)
Yes (via FedEx/DHL/UPS/EMS to International)
We will return your sample via FedEx/DHL/UPS/EMS when "Yes". Just select once for one sample, we will return entire samples in the same order number to your member registered address.
Message
Please Noted Your Special Requirements Here (Ex. Sample Handling Condition, Different Return Address of Sample)
Price
TWD
6,000
Discount
TWD
-
0
Total Price
TWD
6000
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