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Synchrotron Analysis
Spectroscopy
Absorption
Hard X-ray Absorption
Hard X-ray Extended Absorption Fine Structure (HX-EXAFS, 5~30 keV)
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Hard X-ray Extended Absorption Fine Structure (HX-EXAFS, 5~30 keV)
Member Status
Sample Name
*
Sample Information or Chemical Formula (Ex. Fe:Cr,Mn)
*
Target Element Concentration (Ex. Fe/94wt%)
*
Other Elements Concentration (Ex. Cr/3wt%; Mn/3wt%)
*
MSDS No. (Compounds or Precursor)
*
Application Guidelines
*
- Please Select -
Agreed
Disagreed
Sample must be deliver two weeks before experiment time as shown in below. A 70% refund will apply when cancellation informed SGService two weeks ago and no refund afterward. If customer can't send the sample before the due date, SGService will apply the charge and no refund.
Measurement / Date Delivery Time
*
- Please Select -
Japan 2024.11.29 (10-30keV)
Japan 2024.12.24 (5-22keV)
Japan 2025.1.22 (5-22keV)
Japan 2025.1.21 (10-30keV)
The measurement time depends on the beamline as shown, data delivery +3 days after measurement, SGService reserve the right to change.
Measurement Element
*
- Please Select -
Ti K(4,966 eV)
V K(5,465 eV)
Cr K(5,989 eV)
Mn K(6,539 eV)
Fe K(7,112 eV)
Co K(7,709 eV)
Ni K(8,333 eV)
Cu K(8,979 eV)
Zn K(9,659 eV)
Ga K(10,367 eV)
Ge K(11,103 eV)
As K(11,867 eV)
Se K(12,658 eV)
Br K(13,474 eV)
Rb K(15,200 eV)
Sr K(16,105 eV)
Y K(17,038 eV)
Zr K(17,998 eV)
Nb K(18,968 eV)
Mo K(20,000 eV)
Tc K(21,044 eV)
Ru K(22,117 eV)
Rh K(23,220 eV)
Pd K(24,350 eV)
Ag K(25,514 eV)
Cd K(26,711 eV)
E > 27,000 eV
Cs L(5,012 eV)
Ba L(5,247 eV)
La L(5,483 eV)
Ce L(5,723 eV)
Pr L(5,964 eV)
Nd L(6,208 eV)
Pm L(6,459 eV)
Sm L(6,716 eV)
Eu L(6,977 eV)
Gd L(7,243 eV)
Tb L(7,514 eV)
Dy L(7,790 eV)
Ho L(8,071 eV)
Er L(8,358 eV)
Tm L(8,648 eV)
Yb L(8,944 eV)
Lu L(9,244 eV)
Hf L(9,561 eV)
Ta L(9,881 eV)
W L(10,207 eV)
Re L(10,535 eV)
Os L(10,871 eV)
Ir L(11,215 eV)
Pt L(11,564 eV)
Au L(11,919 eV)
Hg L(12,284 eV)
Tl L(12,658 eV)
Pb L(13,035 eV)
Bi L(13,419 eV)
Choose Your Measurement Element
Concentration Range
*
- Please Select -
Single Atom Materials
x < 1.0 wt%
1.0 ~ 5.0 wt%
5.0 ~ 10.0 wt%
> 10.0 wt%
Target Element Concentration (in weight percentage)
Sample Form
*
- Please Select -
Powder
Layers
Liquid
Others
Sample Form
Thickness of Thin Film
*
- Please Select -
Nonfilm Type
< 1 um
< 10 um
10 um < x < 100 um
> 100 um
Select the thickness (not included substrate) range (um) of film type sample
Data Quality Assurance
*
- Please Select -
No Need (S/N > 4 for k-space < 6)
S/N > 4 (p-p) for k-space < 8
S/N > 4 (p-p) for k-space < 10
S/N > 4 (p-p) for k-space < 12
We used standard exposure time for different sample concentration. If you want to obtain good enough result of raw data for further analysis, please select the options to increase the exposure time.
Data Analysis
*
- Please Select -
Raw Data
Basic Data Analysis
Advance Data Analysis
Select the data analysis method for your sample. The basic data analysis included E/K/R conversion and advance analysis further included fitting and wavelet-transform.
Return Sample
*
- Please Select -
No (Disposal Fee)
Yes (ONLY for Taiwan)
Yes (via FedEx/DHL/UPS/EMS to International)
We will return your sample via FedEx/DHL/UPS/EMS when "Yes". Just select once for one sample, we will return entire samples in the same order number to your member registered address.
Message
Please Noted Your Special Requirements Here (Ex. Sample Handling Condition, Different Return Address of Sample)
Price
TWD
10,500
Discount
TWD
-
0
Total Price
TWD
10500
Go to get your member discount !
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Amount conversion
TWD
10500
USD
336
EUR
310.1
CHF
291
JPY
50071.5
CNY
2416.8
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265.2
AUD
512.5
SGD
451.4
CAD
455.6
NZD
552.1
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