MUST Ultra-fast X-ray CT

SGService Ultra-fast CT (MUST): ✅ Sub-micron resolution ✅ Non-destructive ✅ Inline-ready integration ✅ Low dose & cost for real-time monitoring

Strain and Defect Analyzer of SiC Ingot/Wafer

Using X-ray NDT method to obtain the orientation, strain/stress and BPD/TED/TSD defects of SiC ingots and wafers in very short inspection time.

MetalJet E1+ 160 kV

At 1000 watts, the new Excillum MetalJet E1+ delivers 17 times more X-ray flux across a broad spectral range compared to a 30 W conventional tungsten-solid-anode microfocus source with the same 30 µm

NanoTube N3

The Excillum NanoTube N3 is based on advanced electron optics and the latest tungsten-diamond transmission target technology. Automatic e-beam focusing and astigmatism correction ensures that the smal

EIGER2 X/XE CdTe Series

DECTRIS EIGER2® X/XE CdTe photon-counting detectors provide high quantum efficiency for hard X-ray energies up to 100 keV, with a spatial resolution of 75 µm. Their cadmium-telluride sensor, which is 750 µm thick, brings all the advantages of EIGER2 X-ray detectors to high-energy applications. A high frame rate up to 2,000 kHz; under 100 ns of effective dead time between exposures; and ideal counting statistics enabled by a sharp, single-pixel point-spread function guarantee outstanding performance and accurate data collection. Furthermore, these beamline detectors offer two independent energy thresholds that will enable you to suppress fluorescence background (with the lower threshold) while measuring the contribution of higher harmonics (with the upper threshold). EIGER2 X/XE CdTe detectors come in different geometries and performances, and with optional vacuum capability. DECTRIS’ dedicated Support and Commissioning team will help you minimize any downtime.

EIGER2 S Series

DECTRIS EIGER2® S photon-counting X-ray detectors are the perfect choice if your research requires large-area, high-resolution beamline detectors, but not the ultimate speed. Like all EIGER2 detectors, this camera with 75-µm pixels delivers data with the highest spatial resolution. It includes two independent energy thresholds for spectral sensitivity, a single-pixel point-spread function for ideal counting statistics, and fast image readout with a frame rate up to 1 kHz. Equipped with a silicon sensor that is 450 µm thick, EIGER2 S detectors cover X-ray energies between 6 and 40 keV. EIGER2 S detectors come in a variety of sizes. Their robustness, combined with excellent support, make EIGER2 S detectors the most reliable and future-proof tool for cost-conscious beamlines.

MYTHEN2 R Series

DECTRIS® MYTHEN2 strip detectors bring synchrotron-like detection to the lab for all X-ray diffraction, scattering, and spectroscopy techniques. Their radiation hardness and maintenance-free operation make these detectors the perfect choice for academic research, multi-purpose service laboratories, portable diffractometers, and industrial sites that employ Good Manufacturing Practice (GMP) and Good Laboratory Practice (GLP) rules. MYTHEN2 R offers the narrowest strip width (50 μm) on the market, providing unprecedented signal resolution. Single-photon counting eliminates dark current and readout noise while delivering superior data. MYTHEN2 R detectors also combine noise-free performance with high quantum efficiency for the widest X-ray energy range: from Ti to Ag. This unique combination of features will help you make the most of weak laboratory sources by maximizing the signal-to-noise ratio and minimizing measurement and data processing times.

ARINA Detector

DECTRIS ARINA® retractable, electron-counting detector was specifically developed for 4D STEM applications. Featuring a new ASIC, it combines an extreme speed of up to 120,000 frames per second with a high dynamic range and noise-free readout, thus enabling high-quality data acquisition at the native speed of a conventional STEM measurement. Thanks to DECTRIS’ hybrid-pixel technology, ARINA can employ different sensor materials and perform optimally in the whole energy range of 30-300 keV. DECTRIS ARINA fits the bill for a broad spectrum of 4D STEM applications with dwell times below 10 μs, from crystalline-phases and orientation mapping to ptychography - including flexible STEM images reconstruction with virtual detectors.

QUARDO Detector

Based on hybrid-pixel technology, QUADRO is the first direct electron detector to be released by DECTRIS. It incorporates our signature instant retrigger, continuous readout, and noise-free acquisition. Even at high count rate (up to 10 million el/s/pix), DECTRIS QUADRO® detector is able to count every single electron, and thus assures more accurate data collection. Thanks to QUADRO’s exceptionally high dynamic range, your experimental setup will no longer require a beam stopper, and this will allow you to obtain uninterrupted diffraction patterns. This characteristic, combined with QUADRO detector’s speed and sensitivity, make it a game-changer for techniques such as Micro-Electron Diffraction (microED), electron imaging, strain imaging, and ptychography.

ELA Detector

DECTRIS ELA® electron-counting detector offers best-in-class performance in terms of detector noise, frame rate, and dynamic range. It can handle a probe current well over 100 pA, and it simultaneously captures weak and intense reflections to enable advanced diffraction and imaging studies. In addition, it allows for fast elemental mapping in one go, which is especially crucial when working with beam-sensitive materials. ELA hybrid-pixel detector is specifically optimized for Electron Energy Loss Spectroscopy (EELS) and Four-Dimensional Scanning Transmission Electron Microscopy (4D STEM).

SINGLA Detector

DECTRIS SINGLA® detector is a hybrid-pixel electron-counting camera optimized for Life Science applications. With a sensitive area of roughly 1,000 x 1,000-pixels, it is suitable for Cryo-Electron Microscopy (cryoEM) and Micro-Electron Diffraction (microED) applications. Experiments in single-particle analysis and cryo-electron tomography also benefit greatly from this detector’s speed. In addition, SINGLA detector’s fast readout speed (exceeding 2,000 frames per second), combined with its superior dynamic range, make it the ideal detector for small-molecule and 3D micro-crystallography. The detector is bottom-mounted and compatible with JEOL and Thermo Fisher Scientific Transmission Electron Microscopes (TEM).

Design & Manufacture of Multifunctional Nanoscale Computed Tomography System